Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe che...
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MDPI AG
2025-01-01
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Online Access: | https://www.mdpi.com/2079-3197/13/1/15 |
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author | Dmitry V. Efanov Tatiana S. Pogodina Nazirjan M. Aripov Sunnatillo T. Boltayev Asadulla R. Azizov Elnara K. Ametova Feruza F. Shakirova |
author_facet | Dmitry V. Efanov Tatiana S. Pogodina Nazirjan M. Aripov Sunnatillo T. Boltayev Asadulla R. Azizov Elnara K. Ametova Feruza F. Shakirova |
author_sort | Dmitry V. Efanov |
collection | DOAJ |
description | This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean functions and also belong to the codewords of Hsiao codes (these are codes with an odd column of weights). The authors have established that all check functions can be self-dual for a certain number of the Hsiao codes’ data symbols. Such codes can be used in the synthesis of concurrent error-detection circuits by two diagnostic signs. The paper describes the structure of an organization for a concurrent error-detection circuit based on Hsiao codes with self-dual check functions. Some experimental results are presented on the synthesis of self-checking devices using the proposed methodology. The controllability of the structure and the number of test combinations both increased. Hsiao codes can be effectively used with self-dual check functions in the synthesis of self-checking digital devices. |
format | Article |
id | doaj-art-093f29ff548e4e1ea6c626a5b9376af2 |
institution | Kabale University |
issn | 2079-3197 |
language | English |
publishDate | 2025-01-01 |
publisher | MDPI AG |
record_format | Article |
series | Computation |
spelling | doaj-art-093f29ff548e4e1ea6c626a5b9376af22025-01-24T13:27:48ZengMDPI AGComputation2079-31972025-01-011311510.3390/computation13010015Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check FunctionsDmitry V. Efanov0Tatiana S. Pogodina1Nazirjan M. Aripov2Sunnatillo T. Boltayev3Asadulla R. Azizov4Elnara K. Ametova5Feruza F. Shakirova6Higher School of Transport, Institute of Machinery, Materials and Transport, Peter the Great St. Petersburg Polytechnic University, St. Petersburg 195251, RussiaHigher School of Transport, Institute of Machinery, Materials and Transport, Peter the Great St. Petersburg Polytechnic University, St. Petersburg 195251, Russia«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, UzbekistanThis paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean functions and also belong to the codewords of Hsiao codes (these are codes with an odd column of weights). The authors have established that all check functions can be self-dual for a certain number of the Hsiao codes’ data symbols. Such codes can be used in the synthesis of concurrent error-detection circuits by two diagnostic signs. The paper describes the structure of an organization for a concurrent error-detection circuit based on Hsiao codes with self-dual check functions. Some experimental results are presented on the synthesis of self-checking devices using the proposed methodology. The controllability of the structure and the number of test combinations both increased. Hsiao codes can be effectively used with self-dual check functions in the synthesis of self-checking digital devices.https://www.mdpi.com/2079-3197/13/1/15self-checking digital devicesHamming codesHsiao codeserror detection in digital devicesconcurrent error-detection circuitcalculations testing by two diagnostic signs |
spellingShingle | Dmitry V. Efanov Tatiana S. Pogodina Nazirjan M. Aripov Sunnatillo T. Boltayev Asadulla R. Azizov Elnara K. Ametova Feruza F. Shakirova Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions Computation self-checking digital devices Hamming codes Hsiao codes error detection in digital devices concurrent error-detection circuit calculations testing by two diagnostic signs |
title | Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions |
title_full | Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions |
title_fullStr | Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions |
title_full_unstemmed | Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions |
title_short | Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions |
title_sort | combinational circuits testing based on hsiao codes with self dual check functions |
topic | self-checking digital devices Hamming codes Hsiao codes error detection in digital devices concurrent error-detection circuit calculations testing by two diagnostic signs |
url | https://www.mdpi.com/2079-3197/13/1/15 |
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