Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe che...

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Main Authors: Dmitry V. Efanov, Tatiana S. Pogodina, Nazirjan M. Aripov, Sunnatillo T. Boltayev, Asadulla R. Azizov, Elnara K. Ametova, Feruza F. Shakirova
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Computation
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Online Access:https://www.mdpi.com/2079-3197/13/1/15
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_version_ 1832588743924514816
author Dmitry V. Efanov
Tatiana S. Pogodina
Nazirjan M. Aripov
Sunnatillo T. Boltayev
Asadulla R. Azizov
Elnara K. Ametova
Feruza F. Shakirova
author_facet Dmitry V. Efanov
Tatiana S. Pogodina
Nazirjan M. Aripov
Sunnatillo T. Boltayev
Asadulla R. Azizov
Elnara K. Ametova
Feruza F. Shakirova
author_sort Dmitry V. Efanov
collection DOAJ
description This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean functions and also belong to the codewords of Hsiao codes (these are codes with an odd column of weights). The authors have established that all check functions can be self-dual for a certain number of the Hsiao codes’ data symbols. Such codes can be used in the synthesis of concurrent error-detection circuits by two diagnostic signs. The paper describes the structure of an organization for a concurrent error-detection circuit based on Hsiao codes with self-dual check functions. Some experimental results are presented on the synthesis of self-checking devices using the proposed methodology. The controllability of the structure and the number of test combinations both increased. Hsiao codes can be effectively used with self-dual check functions in the synthesis of self-checking digital devices.
format Article
id doaj-art-093f29ff548e4e1ea6c626a5b9376af2
institution Kabale University
issn 2079-3197
language English
publishDate 2025-01-01
publisher MDPI AG
record_format Article
series Computation
spelling doaj-art-093f29ff548e4e1ea6c626a5b9376af22025-01-24T13:27:48ZengMDPI AGComputation2079-31972025-01-011311510.3390/computation13010015Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check FunctionsDmitry V. Efanov0Tatiana S. Pogodina1Nazirjan M. Aripov2Sunnatillo T. Boltayev3Asadulla R. Azizov4Elnara K. Ametova5Feruza F. Shakirova6Higher School of Transport, Institute of Machinery, Materials and Transport, Peter the Great St. Petersburg Polytechnic University, St. Petersburg 195251, RussiaHigher School of Transport, Institute of Machinery, Materials and Transport, Peter the Great St. Petersburg Polytechnic University, St. Petersburg 195251, Russia«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, Uzbekistan«Automation and Remote Control» Department, Tashkent State Transport University, Tashkent 100167, UzbekistanThis paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe check bits) belong to the class of self-dual Boolean functions and also belong to the codewords of Hsiao codes (these are codes with an odd column of weights). The authors have established that all check functions can be self-dual for a certain number of the Hsiao codes’ data symbols. Such codes can be used in the synthesis of concurrent error-detection circuits by two diagnostic signs. The paper describes the structure of an organization for a concurrent error-detection circuit based on Hsiao codes with self-dual check functions. Some experimental results are presented on the synthesis of self-checking devices using the proposed methodology. The controllability of the structure and the number of test combinations both increased. Hsiao codes can be effectively used with self-dual check functions in the synthesis of self-checking digital devices.https://www.mdpi.com/2079-3197/13/1/15self-checking digital devicesHamming codesHsiao codeserror detection in digital devicesconcurrent error-detection circuitcalculations testing by two diagnostic signs
spellingShingle Dmitry V. Efanov
Tatiana S. Pogodina
Nazirjan M. Aripov
Sunnatillo T. Boltayev
Asadulla R. Azizov
Elnara K. Ametova
Feruza F. Shakirova
Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
Computation
self-checking digital devices
Hamming codes
Hsiao codes
error detection in digital devices
concurrent error-detection circuit
calculations testing by two diagnostic signs
title Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
title_full Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
title_fullStr Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
title_full_unstemmed Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
title_short Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions
title_sort combinational circuits testing based on hsiao codes with self dual check functions
topic self-checking digital devices
Hamming codes
Hsiao codes
error detection in digital devices
concurrent error-detection circuit
calculations testing by two diagnostic signs
url https://www.mdpi.com/2079-3197/13/1/15
work_keys_str_mv AT dmitryvefanov combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT tatianaspogodina combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT nazirjanmaripov combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT sunnatillotboltayev combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT asadullarazizov combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT elnarakametova combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions
AT feruzafshakirova combinationalcircuitstestingbasedonhsiaocodeswithselfdualcheckfunctions