Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

Combinational Circuits Testing Based on Hsiao Codes with Self-Dual Check Functions

This paper investigates the features of using modified Hamming codes, which are also known as Hsiao codes. Self-checking digital devices are proposed to be implemented with calculations testing using two diagnostic signs. These signs indicate that the functions (there are functions that describe che...

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Bibliographic Details
Main Authors: Dmitry V. Efanov, Tatiana S. Pogodina, Nazirjan M. Aripov, Sunnatillo T. Boltayev, Asadulla R. Azizov, Elnara K. Ametova, Feruza F. Shakirova
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Computation
Subjects:
self-checking digital devices
Hamming codes
Hsiao codes
error detection in digital devices
concurrent error-detection circuit
calculations testing by two diagnostic signs
Online Access:https://www.mdpi.com/2079-3197/13/1/15
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