Pressure-induced alterations in the electrical characteristics of InP semiconductors

We studied the effects of pressure on indium phosphide (InP) semiconductors using powder samples subjected to a pressure range of 0–25 GPa. We analyzed AC impedance, relaxation frequencies, and resistivity at different temperatures to understand how the samples change during metallization. The resul...

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Bibliographic Details
Main Authors: Teng Zhuang, Chen Zhao, Lianhua Tian, Guangrui Gu, Baojia Wu
Format: Article
Language:English
Published: AIP Publishing LLC 2025-04-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0266971
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