Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack

Determination of contact resistivity of ohmic contacts to semiconductor plates by the method Cox-Strack

Modified variant of the method Cox-Strack, which allows to reduce an amount of frontal contacts on the test sample before 2 and simultaneously exclude an operation of the extrapolation of schedules at the determination of the specific contact resistance ρК, is considered. There is shown that con...

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Bibliographic Details
Main Author: R. B. Burlakov
Format: Article
Language:English
Published: Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education 2018-09-01
Series:Омский научный вестник
Subjects:
ohmic contacts
semiconductor plate
measurement of contact resistance
method cox-strack
optimization of measurements
Online Access:https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/4%20(160)/119-123%20%D0%91%D1%83%D1%80%D0%BB%D0%B0%D0%BA%D0%BE%D0%B2%20%D0%A0.%20%D0%91..pdf
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https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/4%20(160)/119-123%20%D0%91%D1%83%D1%80%D0%BB%D0%B0%D0%BA%D0%BE%D0%B2%20%D0%A0.%20%D0%91..pdf

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