Design and implementation of DSP on-chip Flash testing system
In the reliability screening and assessment test of DSP chip, the on-chip Flash erasure durability and data retention test is one of the most important tests. In view of the limitations of built-in self-test and external automated machine testing, this paper proposes the design and implementation of...
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| Format: | Article |
| Language: | zho |
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National Computer System Engineering Research Institute of China
2025-02-01
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| Series: | Dianzi Jishu Yingyong |
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| Online Access: | http://www.chinaaet.com/article/3000170261 |
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| author | Wang Tao Yu Peng Qian Yunying |
| author_facet | Wang Tao Yu Peng Qian Yunying |
| author_sort | Wang Tao |
| collection | DOAJ |
| description | In the reliability screening and assessment test of DSP chip, the on-chip Flash erasure durability and data retention test is one of the most important tests. In view of the limitations of built-in self-test and external automated machine testing, this paper proposes the design and implementation of a test system for on-chip Flash of DSP chip. Based on the analysis of Flash fault types and test algorithms, the hardware schematic diagram and software implementation process are given, and a physical platform is built for effect evaluation. The test results show that the system can realize the on-chip Flash automatic test of multi position DSP chip without manual participation. At the same time, the working status can be displayed in real time, and the data and results in the test process can be automatically saved in the external memory, which is convenient for the statistical analysis of the test results in the later stage. |
| format | Article |
| id | doaj-art-ff5e1e56e91845dcbaa1b0992768f5bc |
| institution | OA Journals |
| issn | 0258-7998 |
| language | zho |
| publishDate | 2025-02-01 |
| publisher | National Computer System Engineering Research Institute of China |
| record_format | Article |
| series | Dianzi Jishu Yingyong |
| spelling | doaj-art-ff5e1e56e91845dcbaa1b0992768f5bc2025-08-20T02:09:34ZzhoNational Computer System Engineering Research Institute of ChinaDianzi Jishu Yingyong0258-79982025-02-01512414510.16157/j.issn.0258-7998.2456503000170261Design and implementation of DSP on-chip Flash testing systemWang Tao0Yu Peng1Qian Yunying2The 58th Research Institute of China Electronics Technology Group CorporationThe 58th Research Institute of China Electronics Technology Group CorporationThe 58th Research Institute of China Electronics Technology Group CorporationIn the reliability screening and assessment test of DSP chip, the on-chip Flash erasure durability and data retention test is one of the most important tests. In view of the limitations of built-in self-test and external automated machine testing, this paper proposes the design and implementation of a test system for on-chip Flash of DSP chip. Based on the analysis of Flash fault types and test algorithms, the hardware schematic diagram and software implementation process are given, and a physical platform is built for effect evaluation. The test results show that the system can realize the on-chip Flash automatic test of multi position DSP chip without manual participation. At the same time, the working status can be displayed in real time, and the data and results in the test process can be automatically saved in the external memory, which is convenient for the statistical analysis of the test results in the later stage.http://www.chinaaet.com/article/3000170261on-chip flasherasure durabilitydata retentiontest system |
| spellingShingle | Wang Tao Yu Peng Qian Yunying Design and implementation of DSP on-chip Flash testing system Dianzi Jishu Yingyong on-chip flash erasure durability data retention test system |
| title | Design and implementation of DSP on-chip Flash testing system |
| title_full | Design and implementation of DSP on-chip Flash testing system |
| title_fullStr | Design and implementation of DSP on-chip Flash testing system |
| title_full_unstemmed | Design and implementation of DSP on-chip Flash testing system |
| title_short | Design and implementation of DSP on-chip Flash testing system |
| title_sort | design and implementation of dsp on chip flash testing system |
| topic | on-chip flash erasure durability data retention test system |
| url | http://www.chinaaet.com/article/3000170261 |
| work_keys_str_mv | AT wangtao designandimplementationofdsponchipflashtestingsystem AT yupeng designandimplementationofdsponchipflashtestingsystem AT qianyunying designandimplementationofdsponchipflashtestingsystem |