Design and implementation of DSP on-chip Flash testing system

In the reliability screening and assessment test of DSP chip, the on-chip Flash erasure durability and data retention test is one of the most important tests. In view of the limitations of built-in self-test and external automated machine testing, this paper proposes the design and implementation of...

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Bibliographic Details
Main Authors: Wang Tao, Yu Peng, Qian Yunying
Format: Article
Language:zho
Published: National Computer System Engineering Research Institute of China 2025-02-01
Series:Dianzi Jishu Yingyong
Subjects:
Online Access:http://www.chinaaet.com/article/3000170261
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