Investigation of the Optical Properties of Silicon-on-Insulator Microring Resonators Using Optical Backscatter Reflectometry
Introduction. Optical backscatter reflectometry is one of the most promising methods used to examine characteristic parameters relevant to the design of microring resonators. This method paves the way for experimental determination of the coupling coefficient and propagation loss. However, experimen...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Saint Petersburg Electrotechnical University "LETI"
2022-12-01
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| Series: | Известия высших учебных заведений России: Радиоэлектроника |
| Subjects: | |
| Online Access: | https://re.eltech.ru/jour/article/view/697 |
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