APA (7th ed.) Citation

Liu, W., Guo, P., Zheng, Z., Chen, S., & Wu, Y. Neural‐Network Potential for Defect Formation Induced by Knock‐On Irradiation Damage in 4H‐SiC. Wiley-VCH.

Chicago Style (17th ed.) Citation

Liu, Wei, Pengsheng Guo, Ziyue Zheng, Shiyou Chen, and Yu‐Ning Wu. Neural‐Network Potential for Defect Formation Induced by Knock‐On Irradiation Damage in 4H‐SiC. Wiley-VCH.

MLA (9th ed.) Citation

Liu, Wei, et al. Neural‐Network Potential for Defect Formation Induced by Knock‐On Irradiation Damage in 4H‐SiC. Wiley-VCH.