A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells

Filamentary switching memristive devices based on the valence change mechanism (VCM) are promising for non-volatile memory applications due to their ability to store multiple resistance states within a single device. To facilitate the integration into circuits, this study presents an advanced compac...

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Main Authors: Seokki Son, Ankit Bende, Daniel Schon, Rana Walied Ahmad, Dennis Nielinger, Vikas Rana, Stephan Menzel
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
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Online Access:https://ieeexplore.ieee.org/document/11083528/
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author Seokki Son
Ankit Bende
Daniel Schon
Rana Walied Ahmad
Dennis Nielinger
Vikas Rana
Stephan Menzel
author_facet Seokki Son
Ankit Bende
Daniel Schon
Rana Walied Ahmad
Dennis Nielinger
Vikas Rana
Stephan Menzel
author_sort Seokki Son
collection DOAJ
description Filamentary switching memristive devices based on the valence change mechanism (VCM) are promising for non-volatile memory applications due to their ability to store multiple resistance states within a single device. To facilitate the integration into circuits, this study presents an advanced compact model designed for multilevel switching in the VCM devices serially connected with transistors in a 1T-1R configuration. This model is an extension of the existing JART (J&#x00FC;lich Aachen Resistive Switching Tools) VCM v1b model, by incorporating state-dependent effective thermal resistance (<inline-formula> <tex-math notation="LaTeX">$R_{\mathrm {th,eff}}$ </tex-math></inline-formula>) based on an electro-thermal continuum model. This enables precise modeling of multilevel behavior and includes the variability in switching cycles to reflect experimental conditions. The validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model&#x2019;s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively. This model offers a robust tool for designing reliable, high-density multilevel ReRAM memory system.
format Article
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issn 2169-3536
language English
publishDate 2025-01-01
publisher IEEE
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spelling doaj-art-fd2ce41c6ed540b5a65b0117763cded82025-08-20T03:14:02ZengIEEEIEEE Access2169-35362025-01-011312728012729110.1109/ACCESS.2025.359014011083528A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R CellsSeokki Son0https://orcid.org/0000-0003-4478-3775Ankit Bende1https://orcid.org/0009-0008-6434-7667Daniel Schon2https://orcid.org/0000-0002-6967-0032Rana Walied Ahmad3https://orcid.org/0000-0002-0445-8110Dennis Nielinger4https://orcid.org/0000-0002-7540-7062Vikas Rana5https://orcid.org/0000-0001-5432-0286Stephan Menzel6https://orcid.org/0000-0002-4258-2673Peter Gr&#x00FC;nberg Institute 7 (PGI-7), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 7 (PGI-7), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 7 (PGI-7), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 7 (PGI-7), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 4 (PGI-4), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 10 (PGI-10), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyPeter Gr&#x00FC;nberg Institute 7 (PGI-7), Forschungszentrum J&#x00FC;lich, J&#x00FC;lich, GermanyFilamentary switching memristive devices based on the valence change mechanism (VCM) are promising for non-volatile memory applications due to their ability to store multiple resistance states within a single device. To facilitate the integration into circuits, this study presents an advanced compact model designed for multilevel switching in the VCM devices serially connected with transistors in a 1T-1R configuration. This model is an extension of the existing JART (J&#x00FC;lich Aachen Resistive Switching Tools) VCM v1b model, by incorporating state-dependent effective thermal resistance (<inline-formula> <tex-math notation="LaTeX">$R_{\mathrm {th,eff}}$ </tex-math></inline-formula>) based on an electro-thermal continuum model. This enables precise modeling of multilevel behavior and includes the variability in switching cycles to reflect experimental conditions. The validation with TaOx-based VCM devices co-integrated with 180 nm n-MOS transistors demonstrates the model&#x2019;s accuracy, achieving consistent multilevel programming across 7-states and capturing cycle-to-cycle variability effectively. This model offers a robust tool for designing reliable, high-density multilevel ReRAM memory system.https://ieeexplore.ieee.org/document/11083528/Compact modelmemristive devicethermal effective resistancemulti-level switching1T-1R cellvalence change mechanism (VCM)
spellingShingle Seokki Son
Ankit Bende
Daniel Schon
Rana Walied Ahmad
Dennis Nielinger
Vikas Rana
Stephan Menzel
A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
IEEE Access
Compact model
memristive device
thermal effective resistance
multi-level switching
1T-1R cell
valence change mechanism (VCM)
title A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
title_full A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
title_fullStr A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
title_full_unstemmed A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
title_short A Comprehensive Compact Model for Multilevel Switching in TaOx-Based Memristive 1T-1R Cells
title_sort comprehensive compact model for multilevel switching in taox based memristive 1t 1r cells
topic Compact model
memristive device
thermal effective resistance
multi-level switching
1T-1R cell
valence change mechanism (VCM)
url https://ieeexplore.ieee.org/document/11083528/
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