Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning

Defect detection constitutes one of the most crucial processes in industrial production. With a continuous increase in the number of defect categories and samples, the defect detection model underpinned by deep learning finds it challenging to expand to new categories, and the accuracy and real-time...

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Main Authors: Zhenwu Lei, Yue Zhang, Jing Wang, Meng Zhou
Format: Article
Language:English
Published: MDPI AG 2024-09-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/24/18/5921
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_version_ 1850259566375206912
author Zhenwu Lei
Yue Zhang
Jing Wang
Meng Zhou
author_facet Zhenwu Lei
Yue Zhang
Jing Wang
Meng Zhou
author_sort Zhenwu Lei
collection DOAJ
description Defect detection constitutes one of the most crucial processes in industrial production. With a continuous increase in the number of defect categories and samples, the defect detection model underpinned by deep learning finds it challenging to expand to new categories, and the accuracy and real-time performance of product defect detection are also confronted with severe challenges. This paper addresses the problem of insufficient detection accuracy of existing lightweight models on resource-constrained edge devices by presenting a new lightweight YoloV5 model, which integrates four modules, SCDown, GhostConv, RepNCSPELAN4, and ScalSeq. Here, this paper abbreviates it as SGRS-YoloV5n. Through the incorporation of these modules, the model notably enhances feature extraction and computational efficiency while reducing the model size and computational load, making it more conducive for deployment on edge devices. Furthermore, a cloud-edge collaborative defect detection system is constructed to improve detection accuracy and efficiency through initial detection by edge devices, followed by additional inspection by cloud servers. An incremental learning mechanism is also introduced, enabling the model to adapt promptly to new defect categories and update its parameters accordingly. Experimental results reveal that the SGRS-YoloV5n model exhibits superior detection accuracy and real-time performance, validating its value and stability for deployment in resource-constrained environments. This system presents a novel solution for achieving efficient and accurate real-time defect detection.
format Article
id doaj-art-f9e689a5c2c64cfbbaa6928f4c05e2b3
institution OA Journals
issn 1424-8220
language English
publishDate 2024-09-01
publisher MDPI AG
record_format Article
series Sensors
spelling doaj-art-f9e689a5c2c64cfbbaa6928f4c05e2b32025-08-20T01:55:50ZengMDPI AGSensors1424-82202024-09-012418592110.3390/s24185921Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental LearningZhenwu Lei0Yue Zhang1Jing Wang2Meng Zhou3The School of Electrical and Control Engineering, North China University of Technology, Beijing 100144, ChinaThe School of Electrical and Control Engineering, North China University of Technology, Beijing 100144, ChinaThe School of Electrical and Control Engineering, North China University of Technology, Beijing 100144, ChinaThe School of Electrical and Control Engineering, North China University of Technology, Beijing 100144, ChinaDefect detection constitutes one of the most crucial processes in industrial production. With a continuous increase in the number of defect categories and samples, the defect detection model underpinned by deep learning finds it challenging to expand to new categories, and the accuracy and real-time performance of product defect detection are also confronted with severe challenges. This paper addresses the problem of insufficient detection accuracy of existing lightweight models on resource-constrained edge devices by presenting a new lightweight YoloV5 model, which integrates four modules, SCDown, GhostConv, RepNCSPELAN4, and ScalSeq. Here, this paper abbreviates it as SGRS-YoloV5n. Through the incorporation of these modules, the model notably enhances feature extraction and computational efficiency while reducing the model size and computational load, making it more conducive for deployment on edge devices. Furthermore, a cloud-edge collaborative defect detection system is constructed to improve detection accuracy and efficiency through initial detection by edge devices, followed by additional inspection by cloud servers. An incremental learning mechanism is also introduced, enabling the model to adapt promptly to new defect categories and update its parameters accordingly. Experimental results reveal that the SGRS-YoloV5n model exhibits superior detection accuracy and real-time performance, validating its value and stability for deployment in resource-constrained environments. This system presents a novel solution for achieving efficient and accurate real-time defect detection.https://www.mdpi.com/1424-8220/24/18/5921cloud-edge collaborationlightweight YoloV5incremental learningdefect detectionelectronics manufacturing
spellingShingle Zhenwu Lei
Yue Zhang
Jing Wang
Meng Zhou
Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
Sensors
cloud-edge collaboration
lightweight YoloV5
incremental learning
defect detection
electronics manufacturing
title Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
title_full Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
title_fullStr Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
title_full_unstemmed Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
title_short Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
title_sort cloud edge collaborative defect detection based on efficient yolo networks and incremental learning
topic cloud-edge collaboration
lightweight YoloV5
incremental learning
defect detection
electronics manufacturing
url https://www.mdpi.com/1424-8220/24/18/5921
work_keys_str_mv AT zhenwulei cloudedgecollaborativedefectdetectionbasedonefficientyolonetworksandincrementallearning
AT yuezhang cloudedgecollaborativedefectdetectionbasedonefficientyolonetworksandincrementallearning
AT jingwang cloudedgecollaborativedefectdetectionbasedonefficientyolonetworksandincrementallearning
AT mengzhou cloudedgecollaborativedefectdetectionbasedonefficientyolonetworksandincrementallearning