Cloud-Edge Collaborative Defect Detection Based on Efficient Yolo Networks and Incremental Learning
Defect detection constitutes one of the most crucial processes in industrial production. With a continuous increase in the number of defect categories and samples, the defect detection model underpinned by deep learning finds it challenging to expand to new categories, and the accuracy and real-time...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-09-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/24/18/5921 |
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