Dark-field X-ray microscopy with structured illumination for three-dimensional imaging

Dark-field X-ray microscopy with structured illumination for three-dimensional imaging

Abstract Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotati...

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Bibliographic Details
Main Authors: Doğa Gürsoy, Kaan Alp Yay, Elliot Kisiel, Michael Wojcik, Dina Sheyfer, Arndt Last, Matthew Highland, Ian Randal Fisher, Stephan Hruszkewycz, Zahir Islam
Format: Article
Language:English
Published: Nature Portfolio 2025-01-01
Series:Communications Physics
Online Access:https://doi.org/10.1038/s42005-025-01952-2
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