Analysis of Power Transfer Efficiency of Standard Integrated Circuit Immunity Test Methods

Direct power injection (DPI) and bulk current injection (BCI) methods are defined in IEC 62132-3 and IEC 62132-4 as the electromagnetic immunity test method of integrated circuits (IC). The forward power measured at the RF noise generator when the IC malfunctions is used as the measure of immunity l...

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Bibliographic Details
Main Authors: Hai Au Huynh, Hak-Tae Lee, Wansoo Nah, SoYoung Kim
Format: Article
Language:English
Published: Wiley 2015-01-01
Series:International Journal of Antennas and Propagation
Online Access:http://dx.doi.org/10.1155/2015/497647
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