Learning to Be a Transformer to Pinpoint Anomalies
To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., <inline-formula> <tex-math notation="LaTeX">$224 \times 224$ </tex-math></inline-formula> pix...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11048772/ |
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