In Situ Transmission Electron Microscopy Investigation of Novel High‐Entropy Silicide (CrFeCoNi)Si Formation at Atomic Scale

In Situ Transmission Electron Microscopy Investigation of Novel High‐Entropy Silicide (CrFeCoNi)Si Formation at Atomic Scale

High‐entropy silicides (HESs) are promising for applications requiring enhanced mechanical properties. Additionally, their unique design concepts make them valuable in microelectronics. However, current research primarily focuses on macroscopic investigations of chemical characteristics and mechanic...

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Main Authors: Chih‐Lin Chiu, An‐Yuan Hou, Che‐Hung Wang, Chien‐Hua Wang, Jia‐Wei Chen, Chun‐Wei Huang, Shih Hsun Chen, Ying‐Hao Chu, Wen‐Wei Wu
Format: Article
Language:English
Published: Wiley-VCH 2025-07-01
Series:Small Structures
Subjects:
atomic scale
high‐entropy alloys
high‐entropy silicide
in situ transmission electron microscopy
silicidation
Online Access:https://doi.org/10.1002/sstr.202400589
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https://doi.org/10.1002/sstr.202400589

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