Elucidating structure-property correlations in ferroelectric Hf0.5Zr0.5O2 films using variational autoencoders
While Hf0.5Zr0.5O2 (HZO) thin films hold significant promise for modern nanoelectronic devices, a comprehensive understanding of the interplay between their polycrystalline structure and electrical properties remains elusive. Here, we present a novel framework combining phase-field (PF) modeling wit...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-06-01
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| Series: | Materials & Design |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S026412752500440X |
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