Method for visualizing detailed profiles of synchrotron X-ray beams using diamond-thin films and silicon drift detectors

Contamination from nearby bending magnet radiation hinders precise and accurate determination of the true beam center of undulator radiation. To solve this problem, a semi-nondestructive method was developed to visualize the detailed profile of a synchrotron radiation beam by using a thin diamond fi...

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Bibliographic Details
Main Authors: Togo Kudo, Shinji Suzuki, Mutsumi Sano, Toshiro Itoga, Hiroyasu Masunaga, Shunji Goto, Sunao Takahashi
Format: Article
Language:English
Published: International Union of Crystallography 2025-05-01
Series:Journal of Synchrotron Radiation
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Online Access:https://journals.iucr.org/paper?S1600577525002838
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