An Explainable Deep Learning Network With Transformer and Custom CNN for Bean Leaf Disease Classification
Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Tran...
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| Main Authors: | R. Karthik, R. Aswin, K. S. Geetha, K. Suganthi |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10904208/ |
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