An Explainable Deep Learning Network With Transformer and Custom CNN for Bean Leaf Disease Classification

Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Tran...

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Bibliographic Details
Main Authors: R. Karthik, R. Aswin, K. S. Geetha, K. Suganthi
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10904208/
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