Remarkable thermal stability of Si-doped γ-Fe2O3 thin films

The thermal stability of Si-doped γ-Fe2O3 thin films was investigated. These films were prepared by using a two-step process. First, Si-doped Fe3O4 thin films were prepared on water-cooled glass substrates by radio frequency sputtering, followed by heat treatment in air for up to 256 days. X-ray dif...

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Bibliographic Details
Main Author: Seishi Abe
Format: Article
Language:English
Published: AIP Publishing LLC 2025-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0272743
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