Moskovskaia, I. M., Boychenko, D. V., & Nikiforov, A. Y. STATISTICAL METHODS USAGE TO IMPROVE DIE WAFERS RADIATION MONITORING EFFICIENCY IN MASS PRODUCTION PROCESS. Joint Stock Company "Experimental Scientific and Production Association SPELS.
Chicago Style (17th ed.) CitationMoskovskaia, Iuliia M., Dmitry V. Boychenko, and Alexander Yu Nikiforov. STATISTICAL METHODS USAGE TO IMPROVE DIE WAFERS RADIATION MONITORING EFFICIENCY IN MASS PRODUCTION PROCESS. Joint Stock Company "Experimental Scientific and Production Association SPELS.
MLA (9th ed.) CitationMoskovskaia, Iuliia M., et al. STATISTICAL METHODS USAGE TO IMPROVE DIE WAFERS RADIATION MONITORING EFFICIENCY IN MASS PRODUCTION PROCESS. Joint Stock Company "Experimental Scientific and Production Association SPELS.