STATISTICAL METHODS USAGE TO IMPROVE DIE WAFERS RADIATION MONITORING EFFICIENCY IN MASS PRODUCTION PROCESS
Die wafers radiation monitoring is a mandatory (for IC’s with radiation hardness requirements) part of product quality control in mass production and a way to confirm that the technological process is able to meet the specified hardness requirements throughout the product life cycle, starting with R...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Joint Stock Company "Experimental Scientific and Production Association SPELS
2025-07-01
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| Series: | Безопасность информационных технологий |
| Subjects: | |
| Online Access: | https://bit.spels.ru/index.php/bit/article/view/1831 |
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