CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler
With the continuous development of science and technology, industrial production has higher and higher requirements for precision. Many high-precision measurement technologies emerge as the times require, and nanoscale grating ruler displacement measurement technology is one of them. As a kind of pr...
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Main Authors: | Jiyuan Sun, Chunlin Tian |
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Format: | Article |
Language: | English |
Published: |
Wiley
2020-01-01
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Series: | Journal of Chemistry |
Online Access: | http://dx.doi.org/10.1155/2020/5142892 |
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