Buried power rail to suppress substrate leakage in complementary field effect transistor (CFET)
In the pursuit of minimizing the track height in standard cell, a design innovation incorporating complementary field-effect transistors (CFETs) and Buried Power Rail (BPR) technology has been introduced. As the track height in conventional standard cells scales down to 3-track standard cell, the di...
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Main Authors: | Eungyo Jang, Jaehyuk Lim, Changhwan Shin |
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Format: | Article |
Language: | English |
Published: |
IOP Publishing
2024-01-01
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Series: | Nano Express |
Subjects: | |
Online Access: | https://doi.org/10.1088/2632-959X/ada0ce |
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