Yoon, M. The Extraction of the Density of States of Atomic-Layer-Deposited ZnO Transistors by Analyzing Gate-Dependent Field-Effect Mobility. MDPI AG.
Chicago Style (17th ed.) CitationYoon, Minho. The Extraction of the Density of States of Atomic-Layer-Deposited ZnO Transistors by Analyzing Gate-Dependent Field-Effect Mobility. MDPI AG.
MLA (9th ed.) CitationYoon, Minho. The Extraction of the Density of States of Atomic-Layer-Deposited ZnO Transistors by Analyzing Gate-Dependent Field-Effect Mobility. MDPI AG.
Warning: These citations may not always be 100% accurate.