Geospatial Robust Wheat Yield Prediction Using Machine Learning and Integrated Crop Growth Model and Time-Series Satellite Data

Geospatial Robust Wheat Yield Prediction Using Machine Learning and Integrated Crop Growth Model and Time-Series Satellite Data

Accurate crop yield modeling (CYM) is inherently challenging due to the complex, nonlinear, and temporally dynamic interactions of biotic and abiotic factors. Crop traits, which historically capture the cumulative effect of these factors, exhibit functional relationships critical for optimizing prod...

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Bibliographic Details
Main Authors: Rana Ahmad Faraz Ishaq, Guanhua Zhou, Guifei Jing, Syed Roshaan Ali Shah, Aamir Ali, Muhammad Imran, Hongzhi Jiang, Obaid-ur-Rehman
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Remote Sensing
Subjects:
precision agriculture
integration
multiple traits
LAI
LSTM
APSIM
Online Access:https://www.mdpi.com/2072-4292/17/7/1140
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