Study on influence of solder voids on power cycling lifetime of IGBT module
Studying the influencing factors of solder lifetime is of great significance to improve the reliability of IGBT modules, but the influence of solder voids as a solder layer defect on the power cycling lifetime of IGBT modules is still unknown. Considering that the process voids generated in the IGBT...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
Editorial Department of Electric Drive for Locomotives
2023-09-01
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| Series: | 机车电传动 |
| Subjects: | |
| Online Access: | http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2023.05.014 |
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| Summary: | Studying the influencing factors of solder lifetime is of great significance to improve the reliability of IGBT modules, but the influence of solder voids as a solder layer defect on the power cycling lifetime of IGBT modules is still unknown. Considering that the process voids generated in the IGBT module manufacturing process have random size and random unknown characteristics, power cycling tests were conducted under the same test conditions for double-sided cooled IGBT modules with different void ratios. The test results show that the higher the void ratio, the shorter the power cycling lifetime of the device under test. In order to reveal its influence mechanism, a three-dimensional finite element model of IGBT modules with different void ratios was established, and the voids built have random size and random position characteristics consistent with the actual process voids. Through finite element simulation, it is found that the higher the void ratio, the greater the maximum temperature of the solder layer and the chip, and the greater the viscoplastic strain caused, so the power cycling life is shorter. According to the power cycling test and fatigue simulation results, the recommended limit value for the void ratio of the IGBT module solder layer is 3%. The research results can provide guidance for the screening steps of solder voids of IGBT modules. |
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| ISSN: | 1000-128X |