Khan, Z. A., Ahmed, W., & Liatsis, P. AMD-FV: Adaptive margin loss and dual path network+ for deep face verification. Public Library of Science (PLoS).
Chicago Style (17th ed.) CitationKhan, Zeeshan Ahmed, Waqar Ahmed, and Panos Liatsis. AMD-FV: Adaptive Margin Loss and Dual Path Network+ for Deep Face Verification. Public Library of Science (PLoS).
MLA (9th ed.) CitationKhan, Zeeshan Ahmed, et al. AMD-FV: Adaptive Margin Loss and Dual Path Network+ for Deep Face Verification. Public Library of Science (PLoS).
Warning: These citations may not always be 100% accurate.