AMD-FV: Adaptive margin loss and dual path network+ for deep face verification.

Face verification is important in a variety of applications, for instance, access control, surveillance, and identification. Existing methods often struggle with the challenges of dataset imbalance and manual hyperparameter tuning. To address this, we propose the Adaptive Margin Loss and Dual Path N...

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Bibliographic Details
Main Authors: Zeeshan Ahmed Khan, Waqar Ahmed, Panos Liatsis
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2025-01-01
Series:PLoS ONE
Online Access:https://doi.org/10.1371/journal.pone.0324485
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