Investigation on the high temperature behaviour of p-GaN HEMTs by different temperature sensitive electrical parameters

Due to recent improvements and technical advantages in applications with high switching frequencies, research is increasingly focusing on GaN high electron mobility transistors (HEMTs). An accurate temperature determination is thereby of particular importance to give precise lifetime estimations and...

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Bibliographic Details
Main Authors: Lukas Hein, Maximilian Goller, Gengqi Li, Marius Lößner, Josef Lutz, Thomas Basler
Format: Article
Language:English
Published: Elsevier 2025-12-01
Series:Power Electronic Devices and Components
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Online Access:http://www.sciencedirect.com/science/article/pii/S2772370425000288
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