Addressing the Conflict between Mobility and Stability in Oxide Thin‐film Transistors

Addressing the Conflict between Mobility and Stability in Oxide Thin‐film Transistors

Abstract Amorphous oxide semiconductor thin‐film transistors (AOS TFTs) are ever‐increasingly utilized in displays. However, to bring high mobility and excellent stability together is a daunting challenge. Here, the carrier transport/relaxation bilayer stacked AOS TFTs are investigated to solve the...

Full description

Saved in:
Bibliographic Details
Main Authors: Lingyan Liang, Hengbo Zhang, Ting Li, Wanfa Li, Junhua Gao, Hongliang Zhang, Min Guo, Shangpeng Gao, Zirui He, Fengjuan Liu, Ce Ning, Hongtao Cao, Guangcai Yuan, Chuan Liu
Format: Article
Language:English
Published: Wiley 2023-05-01
Series:Advanced Science
Subjects:
carrier relaxation
metal oxide semiconductors
percolation theory
photocarrier lifetime
thin‐film transistors
Online Access:https://doi.org/10.1002/advs.202300373
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

https://doi.org/10.1002/advs.202300373

Similar Items