Quantitative micrometer-scale heat dissipation analysis using pixel-level emissivity correction-based operando IR thermography
Infrared (IR) thermography is widely used for non-invasive, real-time thermal analysis of semiconductor devices. However, quantitative measurements remain challenging for heterogeneously integrated devices composed of various materials with varying IR emissivities (ranging from 0 to 1). Here, we pre...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-10-01
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| Series: | Case Studies in Thermal Engineering |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2214157X25011049 |
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