Full-Aperture Reflective Remote Fourier Ptychography with Sample Matching

Full-Aperture Reflective Remote Fourier Ptychography with Sample Matching

Fourier ptychography (FP) can break through the limitations of existing optical systems with a single aperture and realize large field-of-view (FOV) and high-resolution (HR) imaging simultaneously by aperture synthesis in the frequency domain. The method has potential applications for remote sensing...

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Bibliographic Details
Main Authors: Dayong Wang, Jiahao Meng, Jie Zhao, Renyuan Wang, Yunxin Wang, Lu Rong, Shufeng Lin, Ling Li
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Remote Sensing
Subjects:
Fourier ptychography
remote imaging
full aperture
sample matching
high-resolution imaging
Online Access:https://www.mdpi.com/2072-4292/16/22/4276
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https://www.mdpi.com/2072-4292/16/22/4276

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