Mapping winter wheat yield using light use efficiency model with a novel water stress factor depicting the impact of excessive water
Accurate crop yield mapping is critical for ensuring food security and optimizing agricultural management amid increasing climate variability. However, conventional light use efficiency (LUE) models primarily address water deficit impacts while neglecting excessive moisture effects, a critical limit...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2025-07-01
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| Series: | Geo-spatial Information Science |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/10095020.2025.2534105 |
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