Simplifying Masked Image Modeling With Symmetric Masking and Contrastive Learning
Masked image modeling (MIM) has emerged as an effective self-supervised learning paradigm for pre-training Vision Transformers (ViTs) by reconstructing missing pixels from masked image regions. While prior approaches have demonstrated strong performance, they typically rely on random masking strateg...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11080374/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|