Direct Observation of Dry Etch‐Induced Selectivity Tailoring of Alkylate Inhibition Layer Using DMATMS Vapor

Abstract Area‐selective deposition is a key method for enhancing precision in nanofabrication, particularly for next‐generation semiconductor devices. (N,N‐dimethylamino)trimethylsilane (DMATMS) is attracting increasing attention for its ability to form a selective inhibition layer on technologicall...

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Bibliographic Details
Main Authors: Eunji Sim, Ha Eun Cho, Somang Koo, Jin Gyu Kim, Sukgyu Hahm, Myongjong Kwon, Seonhye Hwang, Soyoung Lee, Byungha Park, Kyuwook Ihm
Format: Article
Language:English
Published: Wiley-VCH 2025-05-01
Series:Advanced Materials Interfaces
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Online Access:https://doi.org/10.1002/admi.202400843
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