Simultaneous Corneal Topography and Epithelial Thickness Mapping from a Single Measurement Using Optical Coherence Tomography
Purpose. To evaluate the performance of corneal epithelial thickness mapping (ETM) and demonstrate simultaneous measurement of ETMs and corneal topography using REVO NX (Optopol Technology, Zawiercie, Poland)—an OCT device for anterior and posterior segment imaging. Methods. One hundred thirty-seven...
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| Main Author: | Bartosz L. Sikorski |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2022-01-01
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| Series: | Journal of Ophthalmology |
| Online Access: | http://dx.doi.org/10.1155/2022/7339306 |
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