Simultaneous Corneal Topography and Epithelial Thickness Mapping from a Single Measurement Using Optical Coherence Tomography

Purpose. To evaluate the performance of corneal epithelial thickness mapping (ETM) and demonstrate simultaneous measurement of ETMs and corneal topography using REVO NX (Optopol Technology, Zawiercie, Poland)—an OCT device for anterior and posterior segment imaging. Methods. One hundred thirty-seven...

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Bibliographic Details
Main Author: Bartosz L. Sikorski
Format: Article
Language:English
Published: Wiley 2022-01-01
Series:Journal of Ophthalmology
Online Access:http://dx.doi.org/10.1155/2022/7339306
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