An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry

Fringe projection profilometry (FPP) is a widely employed technique owing to its rapid speed and high accuracy. However, when FPP is utilized to measure shiny surfaces, the fringes tend to be saturated or too dark, which significantly compromises the accuracy of the 3D measurement. To overcome this...

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Main Authors: Hao Wei, Hongru Li, Xuan Li, Sha Wang, Guoliang Deng, Shouhuan Zhou
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/25/6/1942
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author Hao Wei
Hongru Li
Xuan Li
Sha Wang
Guoliang Deng
Shouhuan Zhou
author_facet Hao Wei
Hongru Li
Xuan Li
Sha Wang
Guoliang Deng
Shouhuan Zhou
author_sort Hao Wei
collection DOAJ
description Fringe projection profilometry (FPP) is a widely employed technique owing to its rapid speed and high accuracy. However, when FPP is utilized to measure shiny surfaces, the fringes tend to be saturated or too dark, which significantly compromises the accuracy of the 3D measurement. To overcome this challenge, this paper proposes an efficient method for the 3D measurement of shiny surfaces based on FPP. Firstly, polarizers are employed to alleviate fringe saturation by leveraging the polarization property of specular reflection. Although polarizers reduce fringe intensity, a deep learning method is utilized to enhance the quality of fringes, especially in low-contrast regions, thereby improving measurement accuracy. Furthermore, to accelerate measurement efficiency, a dual-frequency complementary decoding method is introduced, requiring only two auxiliary fringes for accurate fringe order determination, thereby achieving high-efficiency and high-dynamic-range 3D measurement. The effectiveness and feasibility of the proposed method are validated through a series of experimental results.
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issn 1424-8220
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publishDate 2025-03-01
publisher MDPI AG
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series Sensors
spelling doaj-art-cc68eef96b6c45ca9d7087ded69917312025-08-20T01:49:03ZengMDPI AGSensors1424-82202025-03-01256194210.3390/s25061942An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection ProfilometryHao Wei0Hongru Li1Xuan Li2Sha Wang3Guoliang Deng4Shouhuan Zhou5College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaCollege of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaCollege of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaCollege of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaCollege of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaCollege of Electronics and Information Engineering, Sichuan University, Chengdu 610065, ChinaFringe projection profilometry (FPP) is a widely employed technique owing to its rapid speed and high accuracy. However, when FPP is utilized to measure shiny surfaces, the fringes tend to be saturated or too dark, which significantly compromises the accuracy of the 3D measurement. To overcome this challenge, this paper proposes an efficient method for the 3D measurement of shiny surfaces based on FPP. Firstly, polarizers are employed to alleviate fringe saturation by leveraging the polarization property of specular reflection. Although polarizers reduce fringe intensity, a deep learning method is utilized to enhance the quality of fringes, especially in low-contrast regions, thereby improving measurement accuracy. Furthermore, to accelerate measurement efficiency, a dual-frequency complementary decoding method is introduced, requiring only two auxiliary fringes for accurate fringe order determination, thereby achieving high-efficiency and high-dynamic-range 3D measurement. The effectiveness and feasibility of the proposed method are validated through a series of experimental results.https://www.mdpi.com/1424-8220/25/6/1942fringe projection profilometrythree-dimensional measurementhigh dynamic rangespecular reflectioncomplementary decoding
spellingShingle Hao Wei
Hongru Li
Xuan Li
Sha Wang
Guoliang Deng
Shouhuan Zhou
An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
Sensors
fringe projection profilometry
three-dimensional measurement
high dynamic range
specular reflection
complementary decoding
title An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
title_full An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
title_fullStr An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
title_full_unstemmed An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
title_short An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
title_sort efficient 3d measurement method for shiny surfaces based on fringe projection profilometry
topic fringe projection profilometry
three-dimensional measurement
high dynamic range
specular reflection
complementary decoding
url https://www.mdpi.com/1424-8220/25/6/1942
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