An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry

Fringe projection profilometry (FPP) is a widely employed technique owing to its rapid speed and high accuracy. However, when FPP is utilized to measure shiny surfaces, the fringes tend to be saturated or too dark, which significantly compromises the accuracy of the 3D measurement. To overcome this...

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Bibliographic Details
Main Authors: Hao Wei, Hongru Li, Xuan Li, Sha Wang, Guoliang Deng, Shouhuan Zhou
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/25/6/1942
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