On the growth behavior of multiple whiskers generated on Sn/Cu plating −Predicting the growth behavior of the longest whiskers using whisker length distributions

Although several studies have examined whisker growth on Sn/Cu plating, research on whisker growth laws remain limited, particularly regarding the collective growth characteristics of multiple whiskers on plated surfaces. In this study, tin-plated copper (Sn/Cu) samples were prepared and used to obs...

Full description

Saved in:
Bibliographic Details
Main Authors: Y. Sakamoto, S. Ishihara, K. Masuda, W. Yamazaki, M. Shimura
Format: Article
Language:English
Published: Elsevier 2025-05-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785425011871
Tags: Add Tag
No Tags, Be the first to tag this record!