Small Angle X-ray Scattering in Thin Iron Films
By small angle X-ray scattering (SAXS) and atomic force microscopy characteristic sizes are determined, structural features of thin iron films deposited by magnetron evaporation onto substrates from pyroceramics are established. It is shown that morphologically the film is characterized by disorder....
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2014-07-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2014/3/articles/jnep_2014_V6_03023.pdf |
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