Resolution enhancement of scanning electron micrographs using artificial intelligence
Microscopic imaging of materials often requires the examination of large sample areas at high magnification to identify and analyse rare structural features. High-resolution imaging in scanning electron microscopy is particularly time-intensive, as images are acquired through sequential scanning of...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-05-01
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| Series: | Materials & Design |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S0264127525003752 |
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