Impact of Biasing Effects on Turn-On Switching Transients of GaN Power eHEMTs: Repeatability and Consistency
Power electronic designers use I-V device characterization, with source meters and double-pulse testing, to choose devices and to validate the circuit layout of converters. Double pulse testing helps designers predict the performance and efficiency of the final converter, without the cost of high-po...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Open Journal of Industry Applications |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10999099/ |
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