Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

In this study, we employed traditional methods and deep learning models to improve resolution and quality of low-resolution AFM images made under standard ambient scanning. Both traditional methods and deep learning models were benchmarked and quantified regarding fidelity, quality, and a survey tak...

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Bibliographic Details
Main Authors: Samuel Gelman, Irit Rosenhek-Goldian, Nir Kampf, Marek Patočka, Maricarmen Rios, Marcos Penedo, Georg Fantner, Amir Beker, Sidney R. Cohen, Ido Azuri
Format: Article
Language:English
Published: Beilstein-Institut 2025-07-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
deep learning
fast scanning
low resolution
super resolution
Online Access:https://doi.org/10.3762/bjnano.16.83
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https://doi.org/10.3762/bjnano.16.83

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