Analysis of the Elemental Composition of Cu2ZnSnSe4 Films by the PIXE and μ-PIXE Methods

By X-ray characteristic radiation induced by focused proton beam, the distribution of compound components over the area of Cu2ZnSnSe4 (-PІXE) films is investigated and their elemental composition (PІXE) is determined. Nuclear scanning microprobe with the proton beam energy of 1,5 MeV and the transv...

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Bibliographic Details
Main Authors: A.S. Opanasyk, P.V. Koval, D.V. Magilin, A.A. Ponomarev, H. Cheong
Format: Article
Language:English
Published: Sumy State University 2014-06-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2014/2/articles/jnep_2014_V6_02019.pdf
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