Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices

Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices

Additive Manufacturing (AM), as a revolutionary breakthrough in advanced manufacturing paradigms, leverages its unique layer-by-layer construction advantage to exhibit significant technological superiority in the fabrication of complex structural components for aerospace, biomedical, and other field...

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Bibliographic Details
Main Authors: Dingkang Li, Xing Peng, Zhenfeng Ye, Hongbing Cao, Bo Wang, Xinjie Zhao, Feng Shi
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Nanomaterials
Subjects:
additive manufacturing
deep learning
micro-nano damage precursor
defect detection
non-destructive inspection
Online Access:https://www.mdpi.com/2079-4991/15/11/821
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