Solar PV’s Micro Crack and Hotspots Detection Technique Using NN and SVM

Solar PV’s Micro Crack and Hotspots Detection Technique Using NN and SVM

For lifelong and reliable operation, advanced solar photovoltaic (PV) equipment is designed to minimize the faults. Irrespectively, the panel degradation makes the fault inevitable. Thus, the quick detection and classification of panel degradation is pivotal. Among various problems that promote pane...

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Bibliographic Details
Main Authors: David Prince Winston, Madhu Shobini Murugan, Rajvikram Madurai Elavarasan, Rishi Pugazhendhi, O. Jeba Singh, Pravin Murugesan, M. Gurudhachanamoorthy, Eklas Hossain
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Binary tree
feed forward back propagation neural network
hot-spotting
micro crack
PV module
support vector machine
Online Access:https://ieeexplore.ieee.org/document/9535505/
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