Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors

Saved in:
Bibliographic Details
Main Authors: Katsuhiro Ohno, Hisakazu Nishiura, Ken Sato, Sanpei Sakamoto, Hirofumi Ikeo
Format: Article
Language:English
Published: Wiley 1981-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.8.175
Tags: Add Tag
No Tags, Be the first to tag this record!