Adaptive Optimizable Gaussian Process Regression Linear Least Squares Regression Filtering Method for SEM Images
Scanning Electron Microscopy (SEM) images often suffer from noise contamination, which degrades image quality and affects further analysis. This research presents a complete approach to estimate their Signal-to-Noise Ratio (SNR) and noise variance (NV), and enhance image quality using NV-guided Wien...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11015481/ |
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